Journal article
Reliability Characterization for SIMO Communication Systems with Low-Resolution Phase Quantization under Rayleigh Fading
S Gayan, R Senanayake, H Inaltekin, J Evans
IEEE Open Journal of the Communications Society | IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC | Published : 2021
Abstract
This paper investigates the communication reliability for single-input-multiple-output wireless systems with low-resolution phase quantizers. First, the maximum-likelihood detector with n-bit phase quantization is derived when there are N antennas at the receiver. Then, three low-complexity antenna selection strategies for data detection are proposed and their symbol error probability performance is characterized. It is shown that having 3 or more bits is sufficient to attain the full diversity order N, achievable with infinite-bit quantizers, for quadrature phase shift keying modulation under Rayleigh fading. In particular, it is established that the proposed low-complexity max-distance and..
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Awarded by Discovery Early Career Researcher Award (DECRA)
Funding Acknowledgements
This work was supported by the Discovery Early Career Researcher Award (DECRA) under Grant DE180100501.